| 摘要: |
| [目的]探讨仁用杏抗寒性与膜透性、可溶性糖及膜脂过氧化的关系.[方法]采用人工模拟低温处理,对低温胁迫下一窝蜂、优一和龙王帽3种仁用杏枝条的萌芽率、电解质渗出率、可溶性糖含量及MDA含量的变化进行了研究分析.[结果]供试的3种仁用杏品种中,一窝蜂的抗寒能力略强于优一,但显著大于龙王帽.随着低温胁迫的加剧,仁用杏电解质渗出率、可溶性糖含量上升,MDA含量呈"先上升后下降"的变化趋势.[结论]电解质渗出率、MDA含量与抗寒性密切相关,可作为仁用杏抗寒性的鉴定指标;可溶性糖含量与抗寒性相关不密切,不宜作为仁用杏抗寒性的鉴定指标. |
| 关键词: 仁用杏 低温协迫 抗寒性 萌芽率 电解质渗出率 可溶性糖 丙二醛 |
| DOI： |
| 分类号:S641.303.4 Q78 |
| 基金项目:陕西省重大科技专项（2006KZ09-G6） |
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| Effects of low temperature stress on several cold resistance indexes of apricot |
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MA Wei GONG Zhen-hui LI Da-wei JIA Qing-li
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| Abstract: |
| 【Objective】 The relationship among cold resistance of apricot,membrane permeability,soluble sugar contents and lipid peroxidation was explored.【Method】 Artificial low temperature treatment was used to study the changes of electrolyte leakage and soluble sugar content and MDA content of 3 varieties apricot under low temperature stress.【Result】 In 3 varieties apricot,the cold resistance of Yiwofeng was higher than Youyi,which was further higher than Longwangmao.When low temperature stress intensified,electrolyte leakage and soluble sugar content increased,while MDA content increased at first,then decreased.【Conclusion】 Electrolyte leakage and MDA content were closely related to the cold resistance,which could be the identification indexes of cold resistance in apricot.But there was little correlation between soluble sugar content and the cold resistance,so it was not suitable to be used as a index for cold resistance in apricot. |
| Key words: apricot low temperature stress cold resistance germinating rate electrolyte leakage soluble sugar MDA |
